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You are here: Home / IEEE 2011 PROJECTS / Comparing the Defect Reduction Benefits of Code Inspection and Test-Driven Development

Comparing the Defect Reduction Benefits of Code Inspection and Test-Driven Development

February 16, 2012 by IeeeAdmin

This study is a quasi-experiment comparing the software defect rates and implementation costs of two methods of software defect reduction: code inspection and test-driven development. We divided participants, consisting of junior and senior computer science students at a large Southwestern university, into four groups using a two-by-two, between-subjects, factorial design and asked them to complete the same programming assignment using either test-driven development, code inspection, both, or neither. We compared resulting defect counts and implementation costs across groups. We found that code inspection is more effective than test-driven development at reducing defects, but that code inspection is also more expensive. We also found that test-driven development was no more effective at reducing defects than traditional programming methods

Filed Under: IEEE 2011 PROJECTS Tagged With: IEEE Projects 2011 Software Engineering Guntur, IEEE Projects 2011 Software Engineering Hyderabad, IEEE Projects 2011 Software Engineering Vijayawāda, IEEE Projects 2011 Software Engineering Warangal

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